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How branching can change the conductance of ballistic semiconductor devices.
Maryenko, D., Ospald, F., von Klitzing, K., Smet, J.H., Metzger, J.J., Fleischmann, R., Geisel, T. and Umansky, V.
Physical Review B 85 (19): 195329. 31 May 2012

Post-field ionization of singly charged rhodium: An experimental and theoretical study.
Ernst, N. and Jentsch, T.J.
Physical Review B 24 (11): 6234-6241. July 1981

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